Resistive switching behavior of Cr-doped SrZrO 3 perovskite thin films for random access memory applications

Min Kyu Yang, Dal Young Kim, Jae Wan Park, Jeon Kook Lee

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

Au/Cr-doped SrZrO 3/SrRuO 3 thin film structure was fabricated on SrTiO 3 (100) substrates by using pulsed laser deposition (PLD). The Cr-doped SrZrO 3 thin films and SrRuO 3 bottom electrodes were epitaxially grown along the (hh0/001) direction. We have studied their resistive switching behavior and memory effects for ReRAM applications. Reproducible insulator-conductor switching behavior was observed with an on/off resistance ratio of about 20. We could also observe that the I-V characteristic of the structure was not linear but diode-like. This agrees well with previous studies on Pr 0.7Ca 0.3MnO 3, and implies that the Au/SrZrO 3: Cr interfaces play an important role in the resistive switching.

Original languageEnglish
Pages (from-to)S313-S316
JournalJournal of the Korean Physical Society
Volume47
Issue numberSUPPL. 2
StatePublished - Sep 2005

Keywords

  • Memory effects
  • SrZrO
  • Switching behavior

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