Abstract
Nanoelectronic memory based on trapped charge need to be small and fast, but fundamentally it faces a voltage-time dilemma because the requirement of a high-energy barrier for data retention under zero/low electrical stimuli is incompatible with the demand of a low-energy barrier for fast switching under a modest programming voltage. One solution is to embed an atomic-level lever of localized electron-phonon interaction to autonomously reconfigure trap-sites barrier in accordance to the electron-occupancy of the site. Here we demonstrate an atomically levered resistance-switching memory built on locally flexible amorphous nanometallic thin films: charge detrapping can be triggered by a mechanical force, the fastest one being a plasmonic Lorentz force induced by a nearby electron or positron bunch passing in 10-13 s. The observation provided the first real-time evidence of an electron-phonon interaction in action, which enables nanometallic memory to turn on at a subpicosecond speed yet retain long-term memory, thus suitable for universal memory and other nanoelectron applications.
Original language | English |
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Pages (from-to) | 5058-5067 |
Number of pages | 10 |
Journal | Nano Letters |
Volume | 14 |
Issue number | 9 |
DOIs | |
State | Published - 10 Sep 2014 |
Keywords
- Resistive switching memory
- amorphous materials
- electron-phonon interaction
- metal insulator transition
- plasmonic
- pressure (effect)