Resolving voltage-time dilemma using an atomic-scale lever of subpicosecond electron-phonon interaction

Xiang Yang, Ioan Tudosa, Byung Joon Choi, Albert B.K. Chen, I. Wei Chen

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

Nanoelectronic memory based on trapped charge need to be small and fast, but fundamentally it faces a voltage-time dilemma because the requirement of a high-energy barrier for data retention under zero/low electrical stimuli is incompatible with the demand of a low-energy barrier for fast switching under a modest programming voltage. One solution is to embed an atomic-level lever of localized electron-phonon interaction to autonomously reconfigure trap-sites barrier in accordance to the electron-occupancy of the site. Here we demonstrate an atomically levered resistance-switching memory built on locally flexible amorphous nanometallic thin films: charge detrapping can be triggered by a mechanical force, the fastest one being a plasmonic Lorentz force induced by a nearby electron or positron bunch passing in 10-13 s. The observation provided the first real-time evidence of an electron-phonon interaction in action, which enables nanometallic memory to turn on at a subpicosecond speed yet retain long-term memory, thus suitable for universal memory and other nanoelectron applications.

Original languageEnglish
Pages (from-to)5058-5067
Number of pages10
JournalNano Letters
Volume14
Issue number9
DOIs
StatePublished - 10 Sep 2014

Keywords

  • Resistive switching memory
  • amorphous materials
  • electron-phonon interaction
  • metal insulator transition
  • plasmonic
  • pressure (effect)

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