Abstract
Using the current-voltage measurements, we observed the barrier heights of c-plane GaN in Pt and Au Schottky contacts to be higher than those of a-plane GaN. However, the barrier height of c-plane GaN was lower than that of a-plane GaN in the Ti Schottky contacts. The N/Ga ratio calculated by integrating the X-ray photoelectron spectroscopy (XPS) spectra of Ga 3d and N 1s core levels showed that c-plane GaN induced more Ga vacancies near the interface than a-plane GaN in the Ti Schottky contacts, reducing the effective barrier height through an enhancement of the tunneling probability.
| Original language | English |
|---|---|
| Pages (from-to) | 104-107 |
| Number of pages | 4 |
| Journal | Journal of the Korean Physical Society |
| Volume | 60 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 2012 |
Keywords
- Ga vacancies
- Nonpolar GaN
- Schottky contacts