Self-biased anti-parallel diode pair in 130-nm CMOS

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Abstract

This Letter presents a self-biased anti-parallel diode pair (APDP) in a 130-nm standard digital CMOS process. The proposed device employs complementary polysilicon-gate-separated Schottky barrier diodes (SBDs). A parallel RC network in series with the n-well of n-type SBD connected in shunt is used to build-up the self-bias voltage that depends on the input power level. The device exhibits less roll-off in output harmonic power generation at a high input power level due to the automatic adjustment of the I-V curve. The measured cutoff frequency of the device reaches ∼530 GHz at zero-bias. Harmonic power measurements indicate that use of the self-biasing reduces saturation at high input power levels. The self-biased complementary- APDP (C-APDP) generates up to 5.7 dB higher third harmonic power than the cathode-tied C-APDP.

Original languageEnglish
Pages (from-to)1147-1149
Number of pages3
JournalElectronics Letters
Volume52
Issue number13
DOIs
StatePublished - 23 Jun 2016

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