TY - JOUR
T1 - Sinter bonding and formation of a near-full-density bondline at 250 °C via addition of submicrometer Cu particles to micrometer Ag-coated Cu particles
AU - Kim, Sung Yoon
AU - Kim, Myeong In
AU - Lee, Jong Hyun
N1 - Publisher Copyright:
© 2020, Springer Science+Business Media, LLC, part of Springer Nature.
PY - 2020/10/1
Y1 - 2020/10/1
N2 - Pressure-assisted die bonding at 250 °C in air using a paste containing 2 µm Ag-coated Cu particles (Cu@Ag) and 350 nm Cu particles was demonstrated for power device bonding. At a Cu@Ag-to-Cu mixing ratio of 6:4, the sinter-bonded dies showed a considerable average shear strength that approached 25 MPa after only 5 min of bonding. Furthermore, a near-full-density bondline and excellent strength, greater than 30 MPa, were achieved after only 10 min. The remarkably rapid improvement in the strength and microstructure was attributed to the generation of pure Cu nanoparticles on the Cu surfaces by in situ reduction during heating for the bonding.
AB - Pressure-assisted die bonding at 250 °C in air using a paste containing 2 µm Ag-coated Cu particles (Cu@Ag) and 350 nm Cu particles was demonstrated for power device bonding. At a Cu@Ag-to-Cu mixing ratio of 6:4, the sinter-bonded dies showed a considerable average shear strength that approached 25 MPa after only 5 min of bonding. Furthermore, a near-full-density bondline and excellent strength, greater than 30 MPa, were achieved after only 10 min. The remarkably rapid improvement in the strength and microstructure was attributed to the generation of pure Cu nanoparticles on the Cu surfaces by in situ reduction during heating for the bonding.
UR - http://www.scopus.com/inward/record.url?scp=85089444376&partnerID=8YFLogxK
U2 - 10.1007/s10854-020-04227-4
DO - 10.1007/s10854-020-04227-4
M3 - Article
AN - SCOPUS:85089444376
SN - 0957-4522
VL - 31
SP - 16720
EP - 16727
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 19
ER -