Abstract
The electrical and magnetic properties of the spin-valve transistor (SVT) are investigated as a function of transistor size. A new fabrication process, designed to study the size dependence of the SVT properties, uses: silicon-on-insulator (SOI) wafers, a combination of ion beam and wet etching and a negative tone photoresist (SU8) as an insulating layer. The Si/Pt emitter and Si/Au collector Schottky barrier height do not depend on the transistor dimensions. The parasitic leakage current of the Si/Au collector is, however, proportional to its area. The relative collector current change with magnetic field is 240%, independent of size, while the transfer ratio starts to decrease for SVTs with an emitter area below 25 × 25 μm2. The maximum input current is found to be limited by the maximum current density allowed in the base (1.7 × 107 A/cm2), which is in agreement with the maximum current density for spin valves.
Original language | English |
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Pages (from-to) | 847-851 |
Number of pages | 5 |
Journal | IEEE Transactions on Electron Devices |
Volume | 49 |
Issue number | 5 |
DOIs | |
State | Published - May 2002 |
Keywords
- Hot electron
- Magnetic devices
- Reliability
- Schottky diodes
- Spin-valve transistor