Structured puncturing for rate-compatible B-LDPC codes with dual-diagonal parity structure

Hyo Yol Park; Kwang Soon Kim; Dong Ho Kim; Keum Chan Whang

doi:10.1109/T-WC.2008.070409

Structured puncturing for rate-compatible B-LDPC codes with dual-diagonal parity structure

Hyo Yol Park, Kwang Soon Kim, Dong Ho Kim, Keum Chan Whang

Media IT Engineering Program

Yonsei University

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

In this paper, we propose a generalized formula for generating puncturing patterns for block-type low-density parity-check (B-LDPC) codes with dual-diagonal parity structure. The proposed formula distributes punctured bits uniformly in the zigzag edge connections, as well as maximizes the minimum recovery speed and the reliability of each punctured node. Also, the proposed puncturing can be applied to any B-LDPC code with dual-diagonal parity structure and can provide efficient bitwise puncturing patterns even when the number of puncturing bits is not equal to an integer multiple of the block size. Simulation results show that the proposed punctured B-LDPC codes are better than existing punctured B-LDPC codes and even dedicated B-LDPC codes used in commercial standards.

Original language	English
Article number	4657312
Pages (from-to)	3692-3696
Number of pages	5
Journal	IEEE Transactions on Wireless Communications
Volume	7
Issue number	10
DOIs	https://doi.org/10.1109/T-WC.2008.070409
State	Published - Oct 2008

Keywords

Block-type LDPC code
Hybrid ARQ
Rate-compatible code

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10.1109/T-WC.2008.070409

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title = "Structured puncturing for rate-compatible B-LDPC codes with dual-diagonal parity structure",

abstract = "In this paper, we propose a generalized formula for generating puncturing patterns for block-type low-density parity-check (B-LDPC) codes with dual-diagonal parity structure. The proposed formula distributes punctured bits uniformly in the zigzag edge connections, as well as maximizes the minimum recovery speed and the reliability of each punctured node. Also, the proposed puncturing can be applied to any B-LDPC code with dual-diagonal parity structure and can provide efficient bitwise puncturing patterns even when the number of puncturing bits is not equal to an integer multiple of the block size. Simulation results show that the proposed punctured B-LDPC codes are better than existing punctured B-LDPC codes and even dedicated B-LDPC codes used in commercial standards.",

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AB - In this paper, we propose a generalized formula for generating puncturing patterns for block-type low-density parity-check (B-LDPC) codes with dual-diagonal parity structure. The proposed formula distributes punctured bits uniformly in the zigzag edge connections, as well as maximizes the minimum recovery speed and the reliability of each punctured node. Also, the proposed puncturing can be applied to any B-LDPC code with dual-diagonal parity structure and can provide efficient bitwise puncturing patterns even when the number of puncturing bits is not equal to an integer multiple of the block size. Simulation results show that the proposed punctured B-LDPC codes are better than existing punctured B-LDPC codes and even dedicated B-LDPC codes used in commercial standards.

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Structured puncturing for rate-compatible B-LDPC codes with dual-diagonal parity structure

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