TY - JOUR
T1 - Study on bisbenzocyclobutene bonding for the development of a Si-based miniaturized reformer of fuel cell systems
AU - Choi, Dae Hyun
AU - Yeo, Chan Hyeok
AU - Kim, Jean Tae
AU - Ok, Chi Won
AU - Kim, Jong Seok
AU - Kwon, Yongchai
AU - Im, Yeon Ho
PY - 2009
Y1 - 2009
N2 - This paper reports the results of a systematic study of bisbenzocyclobutene (BCB) bonding for a Si-based miniaturized reformer system. The micro reformer system, which included microchannels with a depth and a width of 250 νm and 600 νm, respectively, was fabricated using conventional semiconductor processing and BCB bonding. The structural, thermo-mechanical and chemical stability of Pyrex to Si wafer bonding using BCB as an adhesive was examined at temperatures up to 350 °C. The BCB interfaces at the Pyrex to Si wafer bonding pairs were mechanically stable to withstand the typical pressure and temperature conditions of the reforming process (1 atm and 300 °C) with little outgassing during reforming at 1 atm and 300 °C. The thermo-mechanical and chemical stability during wafer bonding and during reforming was examined using an optical inspection, and pressure pop-up test, FTIR test and gas chromatograph (GC) test were performed. The results showed that Pyrex to Si wafer bonding using BCB is suitable for a miniaturized reformer in fuel systems.
AB - This paper reports the results of a systematic study of bisbenzocyclobutene (BCB) bonding for a Si-based miniaturized reformer system. The micro reformer system, which included microchannels with a depth and a width of 250 νm and 600 νm, respectively, was fabricated using conventional semiconductor processing and BCB bonding. The structural, thermo-mechanical and chemical stability of Pyrex to Si wafer bonding using BCB as an adhesive was examined at temperatures up to 350 °C. The BCB interfaces at the Pyrex to Si wafer bonding pairs were mechanically stable to withstand the typical pressure and temperature conditions of the reforming process (1 atm and 300 °C) with little outgassing during reforming at 1 atm and 300 °C. The thermo-mechanical and chemical stability during wafer bonding and during reforming was examined using an optical inspection, and pressure pop-up test, FTIR test and gas chromatograph (GC) test were performed. The results showed that Pyrex to Si wafer bonding using BCB is suitable for a miniaturized reformer in fuel systems.
UR - http://www.scopus.com/inward/record.url?scp=68249157054&partnerID=8YFLogxK
U2 - 10.1088/0960-1317/19/7/075013
DO - 10.1088/0960-1317/19/7/075013
M3 - Article
AN - SCOPUS:68249157054
SN - 0960-1317
VL - 19
JO - Journal of Micromechanics and Microengineering
JF - Journal of Micromechanics and Microengineering
IS - 7
M1 - 075013
ER -