Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials

Jae Young Chung; Kubilay Sertel; John L. Volakis

doi:10.1109/APS.2008.4619801

Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials

Jae Young Chung, Kubilay Sertel, John L. Volakis

Dept. of Electrical and Information Engineering

Ohio State University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI
DOIs	https://doi.org/10.1109/APS.2008.4619801
State	Published - 2008
Event	2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI - San Diego, CA, United States Duration: 5 Jul 2008 → 12 Jul 2008

Publication series

Name	2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI

Conference

Conference	2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI
Country/Territory	United States
City	San Diego, CA
Period	5/07/08 → 12/07/08

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10.1109/APS.2008.4619801

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Chung, J. Y., Sertel, K., & Volakis, J. L. (2008). Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials. In 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI Article 4619801 (2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI). https://doi.org/10.1109/APS.2008.4619801

Chung, Jae Young ; Sertel, Kubilay ; Volakis, John L. / Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials. 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI. 2008. (2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI).

@inproceedings{f1027c0b549a4ccfae58b288aa7b6574,

title = "Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials",

author = "Chung, \{Jae Young\} and Kubilay Sertel and Volakis, \{John L.\}",

year = "2008",

doi = "10.1109/APS.2008.4619801",

language = "English",

isbn = "9781424420421",

series = "2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI",

booktitle = "2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI",

note = "2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI ; Conference date: 05-07-2008 Through 12-07-2008",

}

Chung, JY, Sertel, K & Volakis, JL 2008, Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials. in 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI., 4619801, 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI, 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI, San Diego, CA, United States, 5/07/08. https://doi.org/10.1109/APS.2008.4619801

Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials. / Chung, Jae Young; Sertel, Kubilay; Volakis, John L.
2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI. 2008. 4619801 (2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials

AU - Chung, Jae Young

AU - Sertel, Kubilay

AU - Volakis, John L.

PY - 2008

Y1 - 2008

UR - http://www.scopus.com/inward/record.url?scp=55649090823&partnerID=8YFLogxK

U2 - 10.1109/APS.2008.4619801

DO - 10.1109/APS.2008.4619801

M3 - Conference contribution

AN - SCOPUS:55649090823

SN - 9781424420421

T3 - 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI

BT - 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI

T2 - 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI

Y2 - 5 July 2008 through 12 July 2008

ER -

Chung JY, Sertel K, Volakis JL. Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials. In 2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI. 2008. 4619801. (2008 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI). doi: 10.1109/APS.2008.4619801

Synthetic aperture Gaussian beam measurement system for wideband characterization of RF materials and metamaterials

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