Abstract
Tellurium (Te) doping of InGaP with diethyl Te (DETe) was investigated to apply for tunnel junctions (TJs) in multijunction solar cells. When the DETe flow rate was 2 sccm, the electron concentration was found to increase with decreasing growth temperature. The obtained electron concentration reached up to ∼ 1,×, 1019 cm-3. The photovoltaic (PV) properties of InGaP/InGaAs/Ge triple-junction solar cells with a Te-doped InGaP layer in TJ were measured under concentrated light condition. Here, Te-doped InGaP layers in TJ were prepared using different growth temperatures ranging from 540 °C to 660 °C. Compared with other samples, open-circuit voltage (VOC), fill factor, and conversion efficiency were higher for the sample with an InGaP grown at 570 °C. For this sample, external quantum efficiency was also found to be higher than the other samples, associated with the improved crystalline quality.
| Original language | English |
|---|---|
| Article number | 7416188 |
| Pages (from-to) | 1594-1599 |
| Number of pages | 6 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 63 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 2016 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- External quantum efficiency (EQE)
- InGaP
- tellurium (Te)
- tunnel junction (TJ)
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