Transverse and longitudinal electrooptic properties of highly (100) oriented Pb(Zr,Ti)O3 films grown on glass substrates

Jong Jin Choi; Gun Tae Park; Hyoun Ee Kim; Dal Young Kim

doi:10.1016/j.tsf.2006.06.009

Transverse and longitudinal electrooptic properties of highly (100) oriented Pb(Zr,Ti)O₃ films grown on glass substrates

Jong Jin Choi, Gun Tae Park, Hyoun Ee Kim, Dal Young Kim

Dept. of Optometry

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

The Pb(Zr,Ti)O₃ [PZT] films with a preferred orientation generally have columnar texture. Because the properties of a PZT film are strongly dependent on its crystallographic direction, the electrooptic properties along the longitudinal and transverse direction are expected to be anisotropic. In this study, highly (100) oriented PZT films were grown on glass and ITO (Indium Tin Oxide) coated glass substrates using the sol-gel multi-coating method with lanthanum nitrate and lanthanum nickel nitrate as buffer layers. The longitudinal and transverse electrooptic properties of the textured films were characterized by transmission-mode measuring equipment with a Senarmont compensator using a sample tilting method. The calculated longitudinal and transverse electrooptic coefficients of the highly (100) oriented PZT films were 147 and 250 pm/V, respectively.

Original language	English
Pages (from-to)	2437-2441
Number of pages	5
Journal	Thin Solid Films
Volume	515
Issue number	4
DOIs	https://doi.org/10.1016/j.tsf.2006.06.009
State	Published - 5 Dec 2006

Keywords

Electrooptic
Oriented film
Pb(Zr,Ti)O
Sol-gel

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10.1016/j.tsf.2006.06.009

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title = "Transverse and longitudinal electrooptic properties of highly (100) oriented Pb(Zr,Ti)O3 films grown on glass substrates",

abstract = "The Pb(Zr,Ti)O3 [PZT] films with a preferred orientation generally have columnar texture. Because the properties of a PZT film are strongly dependent on its crystallographic direction, the electrooptic properties along the longitudinal and transverse direction are expected to be anisotropic. In this study, highly (100) oriented PZT films were grown on glass and ITO (Indium Tin Oxide) coated glass substrates using the sol-gel multi-coating method with lanthanum nitrate and lanthanum nickel nitrate as buffer layers. The longitudinal and transverse electrooptic properties of the textured films were characterized by transmission-mode measuring equipment with a Senarmont compensator using a sample tilting method. The calculated longitudinal and transverse electrooptic coefficients of the highly (100) oriented PZT films were 147 and 250 pm/V, respectively.",

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T1 - Transverse and longitudinal electrooptic properties of highly (100) oriented Pb(Zr,Ti)O3 films grown on glass substrates

AU - Choi, Jong Jin

AU - Park, Gun Tae

AU - Kim, Hyoun Ee

AU - Kim, Dal Young

PY - 2006/12/5

Y1 - 2006/12/5

N2 - The Pb(Zr,Ti)O3 [PZT] films with a preferred orientation generally have columnar texture. Because the properties of a PZT film are strongly dependent on its crystallographic direction, the electrooptic properties along the longitudinal and transverse direction are expected to be anisotropic. In this study, highly (100) oriented PZT films were grown on glass and ITO (Indium Tin Oxide) coated glass substrates using the sol-gel multi-coating method with lanthanum nitrate and lanthanum nickel nitrate as buffer layers. The longitudinal and transverse electrooptic properties of the textured films were characterized by transmission-mode measuring equipment with a Senarmont compensator using a sample tilting method. The calculated longitudinal and transverse electrooptic coefficients of the highly (100) oriented PZT films were 147 and 250 pm/V, respectively.

AB - The Pb(Zr,Ti)O3 [PZT] films with a preferred orientation generally have columnar texture. Because the properties of a PZT film are strongly dependent on its crystallographic direction, the electrooptic properties along the longitudinal and transverse direction are expected to be anisotropic. In this study, highly (100) oriented PZT films were grown on glass and ITO (Indium Tin Oxide) coated glass substrates using the sol-gel multi-coating method with lanthanum nitrate and lanthanum nickel nitrate as buffer layers. The longitudinal and transverse electrooptic properties of the textured films were characterized by transmission-mode measuring equipment with a Senarmont compensator using a sample tilting method. The calculated longitudinal and transverse electrooptic coefficients of the highly (100) oriented PZT films were 147 and 250 pm/V, respectively.

KW - Electrooptic

KW - Oriented film

KW - Pb(Zr,Ti)O

KW - Sol-gel

UR - https://www.scopus.com/pages/publications/33751238525

U2 - 10.1016/j.tsf.2006.06.009

DO - 10.1016/j.tsf.2006.06.009

M3 - Article

AN - SCOPUS:33751238525

SN - 0040-6090

VL - 515

SP - 2437

EP - 2441

JO - Thin Solid Films

JF - Thin Solid Films

IS - 4

ER -

Transverse and longitudinal electrooptic properties of highly (100) oriented Pb(Zr,Ti)O₃ films grown on glass substrates

Abstract

Keywords

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