Trilayer Tunnel Selectors for Memristor Memory Cells

Byung Joon Choi, Jiaming Zhang, Kate Norris, Gary Gibson, Kyung Min Kim, Warren Jackson, Min Xian Max Zhang, Zhiyong Li, J. Joshua Yang, R. Stanley Williams

Research output: Contribution to journalArticlepeer-review

100 Scopus citations

Abstract

An integrated memory cell with a memristor and a trilayer crested barrier selector, showing repeatable nonlinear current-voltage switching loops is presented. The fully atomic-layer-deposited TaN1+x/Ta2O5/TaN1+x crested barrier selector yields a large nonlinearity (>104), high endurance (>108), low variability, and low temperature dependence.

Original languageEnglish
Pages (from-to)356-362
Number of pages7
JournalAdvanced Materials
Volume28
Issue number2
DOIs
StatePublished - 13 Jan 2016

Keywords

  • crested barriers
  • memory cells
  • memristor
  • RRAM
  • tunneling

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