Abstract
An integrated memory cell with a memristor and a trilayer crested barrier selector, showing repeatable nonlinear current-voltage switching loops is presented. The fully atomic-layer-deposited TaN1+x/Ta2O5/TaN1+x crested barrier selector yields a large nonlinearity (>104), high endurance (>108), low variability, and low temperature dependence.
| Original language | English |
|---|---|
| Pages (from-to) | 356-362 |
| Number of pages | 7 |
| Journal | Advanced Materials |
| Volume | 28 |
| Issue number | 2 |
| DOIs | |
| State | Published - 13 Jan 2016 |
Keywords
- crested barriers
- memory cells
- memristor
- RRAM
- tunneling