Tunable Non-Volatile Gate-to-Source/Drain Capacitance of FeFET for Capacitive Synapse

  • Tae Hyeon Kim
  • , Omkar Phadke
  • , Yuan Chun Luo
  • , Halid Mulaosmanovic
  • , Johannes Mueller
  • , Stefan Duenkel
  • , Sven Beyer
  • , Asif Islam Khan
  • , Suman Datta
  • , Shimeng Yu

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

Abstract

Using 'capacitive' crossbar arrays for compute-in-memory (CIM) offers higher energy efficiency compared to 'resistive' crossbar arrays. The non-volatile capacitive (nvCap) synapse has been recently reported in MFM and MFS stacks with asymmetric electrode interfaces. In this work, a foundry FeFET is leveraged as the capacitive synapse for the first time, where the tunable gate-to-drain and gate-to-source capacitances (Cgd and Cgs) are exploited as the capacitive memory states. High capacitance on/off ratio (25) is obtained by relatively low program/erase voltages (±3.5V). Furthermore, it is demonstrated by TCAD simulation that the physical origins of on-state and off-state capacitance are dominated by the inversion capacitance and the overlap capacitance, respectively. Based on these results, design guidelines are presented to further increase the on/off ratio.

Original languageEnglish
Pages (from-to)1628-1631
Number of pages4
JournalIEEE Electron Device Letters
Volume44
Issue number10
DOIs
StatePublished - 1 Oct 2023

Keywords

  • compute-in-memory
  • ferroelectric field-effect transistor
  • Non-volatile capacitive synapse

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