Ultrasensitive pressure sensor based on gate- all-around nanowire fet

Pushpapraj Singh, Jianmin Miao, Woo Tae Park, Dim Lee Kwong

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

There have been limited studies addressing how the fundamental factors affect the piezoresistive sensitivity of transistors. In this work, we demonstrate pressure sensor based on gate-all-around (GAA) nanowire field-effect transistor (NWFET) sensing element. We show eight times sensitivity enhancement of NWFET within a low gate bias (0.4V). The pressure sensitivity ((ΔIDS/IDS)/ΔP) of 0.0045 (psi)1 is achieved for 3.5μm thick diaphragm. Result shows the picoampere current noise in subthreshold regime, which allows measurable output signal for the low pressure detection. Results reveal silicon channel GAA NWFET as a low bias controlled, miniaturized, and ultrasensitive sensing element for nanomechanical sensors.

Original languageEnglish
Title of host publication2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS'11
Pages2734-2737
Number of pages4
DOIs
StatePublished - 2011
Event2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS'11 - Beijing, China
Duration: 5 Jun 20119 Jun 2011

Publication series

Name2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS'11

Conference

Conference2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS'11
Country/TerritoryChina
CityBeijing
Period5/06/119/06/11

Keywords

  • Gate-All-Around
  • Nanowire field-effect Transistor
  • Peizoresistivity
  • Pressure Sensor

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